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A Standardized Reliability Evaluation Framework for Connections
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Authored By:Vince Pascucci, iNEMI Project Chair TE Connectivity Mechanicsburg, PA, USA Shane Kirkbride Keysight Technologies, Inc. Colorado Springs, CO, USA Benson Chan Integrated Electronics Engineering Center (IEEC) / Binghamton University Binghamton, NY, USA Philip Conde Dell Austin, TX, USA Christian Dandl Rosenberger Hochfrequenztechnik GmbH & Co. KG Fridolfing, Bavaria Germany Ife Hsu Intel Corporation Chandler, AZ, USA Bob Martinson Lotes Beaverton, OR, USA Anne Ryan Alcatel-Lucent (Nokia) Dublin, Ireland SummaryThe iNEMI Connector Reliability Test Recommendations Project was organized to address the need for a standardized reliability qualification method for connectors. The project team reviewed current standards pertaining to connector reliability and also conducted an industry-wide connector reliability survey to determine common metrics for connector reliability guidelines across the industry. This paper summarizes their findings and reviews a multilevel interconnect hierarchy and a matrix of application classes defined by the team. It also discusses possible connector reliability test strategies based on the interconnect hierarchy developed. ConclusionsFrom the review of existing documents and the survey responses the project team concluded that there is agreement on the need for some common approach to assessing connector reliability. They also concluded that there is sufficient agreement on definition of levels of interconnect and on primary connector test methods to allow a structure of common application classes and related test conditions to support an effort to develop standard reliability testing protocols for connectors. The iNEMI Connector Reliability Test Recommendations Project team recommends additional work to define specific test conditions to be used to evaluate the expected degradation of connectors used under the stress levels in the defined application classes. This could form the basis for standardized reliability test procedures for each application class. Such a system of standardized testing would allow designers to more easily compare connectors during their initial system design phase. Initially Published in the SMTA Proceedings |
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