circuit insight
Free Subscription
Every issue of the Circuit Insight email newsletter will bring you articles, multimedia information, and updates on the issues affecting you and your company.

Subscribe Today

Insert Your Email Address


Privacy
We respect your privacy. We will never sell, rent, or disclose your email address or any other information to anyone. Your subscription is held strictly confidential. See our Privacy Policy for more information.

Format
The Circuit Insight email newsletter is sent in HTML format.

Unsubscribing
Unsubscribing is simple. At the bottom of every newsletter is a simple link to unsubscribe.
Test, Inspection, X-Ray
PRIOR
 Page 1 of 14 
NEXT

To search a phrase, place it in quotes.
Calibration of Tweezer Meters Enabling Sub 1 pF and Sub 10 nH Measurements
Calibration of Tweezer Meters Enabling Sub 1 pF and Sub 10 nH Measurements
The importance of proper calibration for two-wire measurement setups is reaffirmed. For tweezer meters, this issue is even more critical due to the potentially higher offset values, which can be as large as 19 nH.
Production Floor

Board Level Reliability Testing of RF Packages
Board Level Reliability Testing of RF Packages
The paper presents a summary of board level reliability test performed on RF packages, the assembly process controls and monitoring, mechanical and environmental reliability tests, understanding of failure modes and lessons learned.
Production Floor

Solder Joint Void Metrology to Monitor Solder Joint Quality
Solder Joint Void Metrology to Monitor Solder Joint Quality
We are showing what could be done when using a 2D X-ray system to collect high resolution images and process them with Deep Learning using AI.
Analysis Lab

Measuring the Impact of Test Methods for High-Frequency Circuit Materials
Measuring the Impact of Test Methods for High-Frequency Circuit Materials
How can two different test methods provide Dk measurement that are different? When the methods measure the same circuit material in two different directions.
Analysis Lab

Assessing Electronic Devices with 3D X-Ray Imaging and Electron Microscopy
Assessing Electronic Devices with 3D X-Ray Imaging and Electron Microscopy
This article presents workflows that combine 3D X-ray microscopy, nanoscale tomography, and electron microscopy for visualization of the interior of electronic devices.
Analysis Lab

Artificial Intelligence and Its Role in Improving Automated Optical Inspection
Artificial Intelligence and Its Role in Improving Automated Optical Inspection
With the help of AI we hope to ease the workload of engineering and operation teams while also improving labor cost, efficiency, and product quality. After reviewing the four AI use cases presented in this paper, it is very apparent the overwhelming benefit AI can have with our AOI process and programs.
Production Floor

Board Level Reliability of Large Body Size WlCSP for Automotive Applications
Board Level Reliability of Large Body Size WlCSP for Automotive Applications
This paper will outline the board-level assembly development and reliability that was undertaken to demonstrate this WLCSP could meet the demands of automotive.
Analysis Lab

A Method to Investigate PCB Supplier Rework Processes and  Best Practices
A Method to Investigate PCB Supplier Rework Processes and Best Practices
This paper investigates PCB supplier rework processes, including identifying rework procedures that have potential implications to PCB functionality.
Analysis Lab

Metallurgical and Mechanical Analysis of Castellated Via Rigid-Flex Connection
Metallurgical and Mechanical Analysis of Castellated Via Rigid-Flex Connection
The reliability of castellated vias as a rigid-flex interconnection method is evaluated. This is split into metallurgical aging of joints and investigating mechanical robustness/integrity.
Analysis Lab

Accelerated Corrosion Testing of DRAM Modules for Data Centers
Accelerated Corrosion Testing of DRAM Modules for Data Centers
To investigate corrosion problems in electronic products for server applications, mixed flowing gas (MFG) is widely used as an accelerated testing method.
Analysis Lab

Search
RESEARCH
 


SUPPLIERS
 


ASK THE EXPERTS
 


TECH PAPERS
 


NEWS
 


PRESS